TīmeklisFEI Talos F200X TEM. The FEI Talos™ F200X is a 200 kV FEG Scanning Transmission Electron Microscope (S/TEM), which is designed for fast, precise and quantitative characterization of biological and materials samples. It combines outstanding quality in high resolution STEM and TEM imaging with advances in EDS … Tīmeklis主要参数:工作电压200 KV,配有超高亮度肖特基场发射电子枪,TEM点分辨率0.25 nm,信息分辨率0.12 nm,STEM分辨率0.16 nm,能谱能量分辨率136 eV。 仪器应用:广泛应用在物理、化学以及材料科学中,作为确定物质结构以及成分的一个重要方法,可金属、陶瓷、半导体、塑料等材料进行微区结构观测 ...
扫描电镜-赛默飞(原FEI)透射电镜 Talos F200X S/TEM_产品详情
TīmeklisThe Thermo Scientific™ Talos™ F200X is a scanning transmission electron microscope (S)TEM that combines outstanding high-resolution (S)TEM and TEM imaging with energy dispersive X-ray spectroscopy (EDS) signal detection. 2D/3D chemical … TīmeklisThis is a recording of a virtual workshop on performing atomic-resolution STEM using our FEI Talos F200i S/TEM I conducted today (04/14/21) in full raw, uned... schematica 1.16.4 forge
FEI Talos F200X TEM - Swansea University
TīmeklisTEM information limit - 0.12 nm. TEM point resolution - 0.25 nm. The Thermo Scientific Talos F200X scanning/transmission electron microscope (S/TEM) combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive x-ray spectroscopy (EDS) signal detection and 3D chemical characterization with … Tīmeklis高分辨场发射透射电镜(FEI-Talos F200X) 2024-02-18 14:11 审核人: 一、功能 TEM模式和STEM模式能够对无机材料结构进行高分辨表征和分析; 可对无机材料进行形貌和成分三维重构; 二、技术指标 TEM模式的点分辨率:优于0.25 nm (200 kV); STEM点分辨率:优于0.16 nm (200 kV); 具备Super... TīmeklisTalos F200X S/TEM 采用赛默飞专利的 Super-XTM 集成 EDS 系统,配备四个硅漂移 X 射线探测器,具有极高灵敏度,每秒可收集高达 105 幅能谱。 X-TWIN 物镜集成,**限度地提高了 X 射线收集效率,同时达到给定束流 (甚至是低强度 EDS 信号)下的理想输出计数率。 更轻松地开展研究 Talos S/TEM 采用友好的数字用户界面和**的人体工程学 … schematic 9minecraft